Jing-Jong Shyue

One of the key factors in the field of nano-technology is the microcharacterization of materials and the understanding of interactions at atom/molecular level. Surface analysis techniques including x-ray photoelectron spectrometry and secondary ion mass spectrometry, and electron/ion microscopy are used extensively to understand and improve the synthesis and processing of materials.

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Research Fellow, Research Center for Applied Sciences (RCAS), Academia Sinica, Taiwan, 2015/03-
Professor (Joint appointment), Department of Materials Science and Engineering, NTU, Taiwan, 2015/08-
Associate Professor (Joint appointment), Department of Materials Science and Engineering, NTU, Taiwan, 2011/02-2015/07
Associate Research Fellow, Research Center for Applied Sciences (RCAS), Academia Sinica, Taiwan, 2010/10-2015/03
Assistant Professor (Joint appointment), Department of Materials Science and Engineering, NTU, Taiwan, 2007/08-2011/02
Assistant Professor (Adjunct), Department of Chemistry, NTU, 2006/08-2007/08
Assistant Research Fellow, Research Center for Applied Sciences (RCAS), Academia Sinica, Taiwan, 2006/06-2010/10
Post-Doctor, Department of Materials Science and Engineering, Ohio State University , USA, 2005/01-2006/05
Research Associate, Department of Materials Science and Engineering, Case Western Reserve University, USA, 2004/08-2004/12
Visiting Researcher, Department of Chemical Engineering, Nagoya University, Japan, 2003/10-2003/11
Research Assistant, Department of Materials Science and Engineering, National Tsing Hua University, Taiwan, 2000/05-2000/12