Field-emission gun scanning electron microscope(JeoL JSM-7800F Prime+EDS+EBSD)

Field-emission gun scanning electron microscope(JeoL JSM-7800F Prime+EDS+EBSD)

Technican:

Ms. Yuan-Tzu Lee

Telephone:

886-2-3366-1338

Location:

Room 130-1, College of Engineering

Features:

JeoL JSM-7800F Prime+EDS+EBSD
ULVAC VPS-020 Quick Coater

  1. FEG-SEM: The observation of the microstructure of materials.
  2. EDS: compositional analysis.
  3. EBSD
  4. Coating Au,Pt
  5. Coating C