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Field-emission gun scanning electron microscope(JeoL JSM-7800F Prime+EDS+EBSD)

Field-emission gun scanning electron microscope(JeoL JSM-7800F Prime+EDS+EBSD)

Responsible teacher：

Chao-Sung Lin

Technican：

Ms. Yuan-Tzu Lee

Telephone：

886-2-3366-1338

Location：

Room 130-1, College of Engineering

Features：

JeoL JSM-7800F Prime+EDS+EBSD
ULVAC VPS-020 Quick Coater

  1. FEG-SEM: The observation of the microstructure of materials.
  2. EDS: compositional analysis.
  3. EBSD
  4. Coating Au,Pt
  5. Coating C