200kV field-emission gun transmission electron microscope (FEI Tecnai G2 F20)

Features：

1.To acquire high-resolution image, bright-field image, dark-field image, electrondiffraction patterns, as well as EDX microanalysis.

2.To acquire Z-contrast image using a high angle annular dark field detector and to perform EDX mapping and EDX line scanning.

3.To construct 3-D images of nanostructures using the specimen holder for tomography.