300kV field-emission gun transmission electron microscope (FEI Tecnai G2 F30)

300kV field-emission gun transmission electron microscope (FEI Tecnai G2 F30)

Technican:

Mr. Hsueh-Ren Chen

Telephone:

886-2-3366-1348

Location:

Room 124, College of Engineering

Features:

Philips Tecnai F30 Field Emission Gun Transmission Micro-scope (FEG-TEM), EDAX Energy Dispersive X-Ray Spectrometer (EDS)

1. To acquire high-resolution image, bright-field image, dark-field image, electrondiffraction patterns.as well as EDXmicroanalysis.

2. To acquire Z-contrast image using a high angle annular dark field detector and to perform EDX mapping and EDX line scanning.

3. To acquire energy-fitered image using a Gatan Image Filter and to perform EELS analysis and its image mapping.