6/22 Seminar Speech

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建立於 2020-06-17, 週三 09:36

最近更新於 2020-06-23, 週二 09:36

發佈於：2020-06-17, 週三 09:37

點擊數：4320

Speaker: Doctor Chi Chen

Topic: Near Field Spectroscopic Imaging: from Hard to Soft Materials

Speaker：Doctor Chi Chen

Organization：Center for applied science, Academia Sinica

Topic：Near Field Spectroscopic Imaging: from Hard to Soft Materials

Date：10:20 , 2020.6.22

Location：Room 203, College of Engineering

Education：

University of California- Irvine (U.S.A.) / Chemistry / PhD

National Taiwan University / Chemistry / MS

National Taiwan University / Chemistry / BS

Work Experience：

Academia Sinica / Center for applied science / Assistant research fellow

RIKEN / Nanophotonics laboratory / Postdoctoral researcher

Abstract：

Scanning near field optical microscopy (SNOM) is a scanning probe technique that combines optics with atomic force microscopy (AFM) to achieve sub-diffraction limit optical resolution. We design and build a horizontal-type aperture based SNOM setup (a-SNOM) with superior mechanical stability toward high resolution and non-destructive topographic and optical imaging. We adopt the torsional resonance (TR) mode for the AFM operation to achieve a better force sensitivity and a higher spatial resolution even with the blunt a-SNOM tip. In this talk, we will first present simultaneous SNOM fluorescence and topographic imaging of transition metal dichalcogenides (TMD) and self-assembled P3HT nanowires with a lateral optical resolution of 60~80 nm. Finally, SNOM imaging of fluorescent dye-labeled lipid domains is successfully achieved without sample damage by our horizontal-type a-SNOM system.