6/22(一)專題演講公告

演講人陳祺   博士

服務單位中央研究院應用科學研究中心

演講題目Near Field Spectroscopic Imaging: from Hard to Soft Materials

演講時間109622(星期一)早上1020

演講地點工綜館203國際演講廳

個人學歷

美國加州大學爾灣分校 / 化學系 / 博士

國立臺灣大學 / 化學系 / 碩士

國立臺灣大學 / 化學系 / 學士

個人經歷

中央研究院 / 應用科學研究中心 / 助研究員

RIKEN / Nanophotonics laboratory / 博士後研究員

演講摘要

Scanning near field optical microscopy (SNOM) is a scanning probe technique that combines optics with atomic force microscopy (AFM) to achieve sub-diffraction limit optical resolution. We design and build a horizontal-type aperture based SNOM setup (a-SNOM) with superior mechanical stability toward high resolution and non-destructive topographic and optical imaging. We adopt the torsional resonance (TR) mode for the AFM operation to achieve a better force sensitivity and a higher spatial resolution even with the blunt a-SNOM tip. In this talk, we will first present simultaneous SNOM fluorescence and topographic imaging of transition metal dichalcogenides (TMD) and self-assembled P3HT nanowires with a lateral optical resolution of 60~80 nm. Finally, SNOM imaging of fluorescent dye-labeled lipid domains is successfully achieved without sample damage by our horizontal-type a-SNOM system.

出席學生

僅學號末一碼為奇數同學須出席 (學號末一碼為偶數同學請至CEIBA及NTU COOL線上學習)

20200622-1