6/10 Seminar Speech

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Speaker: Mr. Jerry Shieh

Topic: Semiconductor Reliability Introduction

SpeakerMr. Jerry Shieh

OrganizationWestern Digital

TopicSemiconductor Reliability Introduction

Date10:20 , 2019.6.10

LocationRoom 203, College of Engineering

Education

National Taiwan Ocean University / Institute of Materials Engineering / MS

Feng Chia University / Materials Science and Engineering / BS

Work Experience

Western Digital / ASIC Development Engineering / Characterization & Failure Analysis, eSSD / Senior Manager

Qualcomm / Product / Yield, Failure Analysis / Staff Engineer

UMC / CRD / Reliability / Senior Engineer

Abstract

Basic Concept :

Introduction of Process Reliability

BEOL (Interconnect)

FEOL (Device)

Introduction of Product Reliability

ESD

Latchup

20190610