6/10 Seminar Speech

• 
• 

User Rating:  / 0

Details

Parent Category: News

Category: Speeches

Created on Tuesday, 04 June 2019 09:28

Last Updated on Monday, 10 June 2019 13:13

Published on Tuesday, 04 June 2019 09:30

Hits: 4067

Speaker: Mr. Jerry Shieh

Topic: Semiconductor Reliability Introduction

Speaker：Mr. Jerry Shieh

Organization：Western Digital

Topic：Semiconductor Reliability Introduction

Date：10:20 , 2019.6.10

Location：Room 203, College of Engineering

Education：

National Taiwan Ocean University / Institute of Materials Engineering / MS

Feng Chia University / Materials Science and Engineering / BS

Work Experience：

Western Digital / ASIC Development Engineering / Characterization & Failure Analysis, eSSD / Senior Manager

Qualcomm / Product / Yield, Failure Analysis / Staff Engineer

UMC / CRD / Reliability / Senior Engineer

Abstract：

Basic Concept :

Introduction of Process Reliability

BEOL (Interconnect)

FEOL (Device)

Introduction of Product Reliability

ESD

Latchup