5/20 Seminar Speech

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Speaker: Prof. Xiaozhou Liao

Topic: Exploring Materials Behaviours Using in-situ Electron Microscopy Techniques

SpeakerProf. Xiaozhou Liao

OrganizationThe University of Sydney, Australia

TopicExploring Materials Behaviours Using in-situ Electron Microscopy Techniques

Date10:20 , 2019.5.20

LocationRoom 203, College of Engineering


Dr. Xiaozhou Liao is a full professor in the University of Sydney, Australia. He conducted his postgraduate research in the School of Physics, University of Sydney and received a PhD degree in 2000 under the supervision of late professor David Cockayne FRS. He moved to USA taking up a Director Funded Postdoctoral Fellowship in Los Alamos National Laboratory in 2001 and was a research scientist in the University of Chicago from 2004 to 2006. He returned to Sydney as a lecturer in June 2006 and was promoted to full professor in January 2013. Dr. Liao's research interest focuses on the structures and synthesis/processing–structure–property relationships of advanced structural and functional materials using ex-situ and in-situ electron microscopy techniques. He has published over 230 journal papers that have been collectively cited more than 11,200 times with an h-index of 54 (data from Web of Science).


A major goal of materials research is to explore how the microstructure of materials affect their properties. Previous investigations on structure–property relationships were usually carried out by separate structural characterisation and property measurements, which, in many cases, fails to reveal the true nature of the structure–property relationships and the origins of materials properties. With recent advances in in-situ microscopy techniques, it is now possible to conduct simultaneous property measurement and structural imaging in the electron microscope. Such capabilities enable researchers to correlate the measured physical, chemical and mechanical properties with local structures and structural evolution of materials under external stimulations. They also provide a platform for visualising and manipulating individual nanomaterials and characterising their properties, which is otherwise impossible using conventional property measurement techniques. In the last several years, my group has taken advantage of advanced in-situ microscopy techniques to explore the properties and structure–property relationships of several types of materials including metallic materials, semiconductor nanowires, and ferroelectric materials. In this presentation, I will discuss some of the projects that my group has worked on in the last few years.