10/17 Seminar Speech

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建立於 2016-10-11, 週二 10:24

最近更新於 2016-10-18, 週二 09:17

發佈於：2016-10-11, 週二 10:30

點擊數：3967

Speaker：Baptiste Gault
Topic：A Not-So-Brief Inroduction to Atom Probe Tomography

Speaker：Baptiste Gault

Organization：Max-Planck-Institut für Eisenforschung GmbH

Topic：A Not-So-Brief Inroduction to Atom Probe Tomography

Date： 10:10 , 2016.10.17

Location：Room B03,College of Engineering

Resume：

2006    University of Rouen, France

Earned a PhD degree

2006-2012

The Australian Centre for Microscopy & Microanalysis at The University of Sydney, Australia

Research scientist: developing the pulsed-laser atom probe microscope

The Department of Materials, University of Oxford, UK

As Marie Curie postdoctoral fellow

The University of Sydney, Australia

On a joint position with the Australian Nuclear Science & Technology Organisation

McMaster University, Canada

A short stint as assistant professor

2012-2015    Elsevier Ltd

Position:Publisher

Managed some archival journals in materials science, such as Acta Materialia and Journal of Nuclear Materials and was Associate Editor for Materials Today

2016 Max-Planck-Institute für Eisenforschung, Düsseldorf

the Group Leader for Atom Probe Tomography

 

Over 2005–2016, I have authored over 75 peer-reviewed research articles in international journals, a book on atom probe tomography as part of the Springer Series in Materials Science, have given a dozen invited talks, organized and chaired sessions at international conferences and workshops, and have given invited seminars in major universities and research institutes in China, the USA, France, Germany, and Japan etc.

 

Abstract：

Atomic-scale microscopy and microanalysis fundamentally drive basic advances in materials science, allowing for correlating materials and devices properties to their atomic structure and chemical composition. Atom probe tomography (APT) is a modern technique that is fast rising in prominence for nanoscale characterisation of structural and functional materials. APT relies on an intense positive electric field that induces the emission of individual atoms in the form of ions, from the surface of a sharp, sub-micron needle-shaped specimen. Treatment and reconstruction of the APT data results in a 3D point-cloud with near-atomic resolution, thereby providing insights into the composition of microstructural structural features such as precipitates, interfaces and grain boundaries which control the properties of materials.
After an introduction to the fundamentals of APT, I will showcase applications of the technique to a range of materials, with an emphasis on correlative approaches with electron microscopy.