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Created on Tuesday, 01 April 2014 12:19
Last Updated on Thursday, 10 April 2014 10:51
Published on Tuesday, 01 April 2014 12:21
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Speaker: Prof. K. W. Lin
Topic: The Structural and Magnetic Characterization of Ion-beam Deposited Thin Film

Speaker: Prof. K. W. Lin

Organization: Professor, Department of Materials Science and Engineering, National Chung Hsing University

Topic: The Structural and Magnetic Characterization of Ion-beam Deposited Thin Film

Time: 10:20 AM ~ 12:10 PM, 2014.2.24

Location: Room203, College of Engineering

Synopsis:
In this study, we investigated the exchange bias (coupling) effects in CoFe/(Co,Fe)O bilayers by using different single crystal substrates of MgO(100) and MgO(110) and Ar ion-beam bombardment on the surface of the bottom antiferromagnet (Co,Fe)O layer before capping with ferromagnet CoFe. In the CoFe/(Co,Fe)O/MgO(110) bilayer, above the irreversibility temperature (Tirr. ~170 K), there was a rapid decrease in M(T) with increasing temperature, unlike the CoFe/ (Co,Fe)O/MgO(100) film that showed an increased Tirr.~300K and no observable decrease in M(T) above Tirr. The different M vs T zero-field-cooled/field-cooled behavior of the CoFe/ (Co,Fe)O bilayers on MgO(100) and MgO(110) indicated that the FM CoFe spin orientations were affected by the different substrates used via exchange coupling to the AF (Co,Fe)O layer altered by MgO.